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Wafer Testing
Wafer Test是利用各自的IC专用Tester,探索Wafer上的全部Chip,确认Device的机能或性能与设计是否一致的工序,对O/S检查及功能能否运行等实施全面测试,甄别Pass/Fail在此过程中只辨别优良产品(Good die),次品在Chip表面进行Ink Dotting等后续装配(Assembly)时进行剔除。利用 Auto Wafer Prober大部分可自动完成。
Produce Specification
Produce Specification
Application Vendor Model Specification Remark
(Pin mux, Pattern mux)
DDI T6371(ND1) 250MHz
Advantest T6372(ND2) 437.5MHz
T6373(ND3) 437.5MHz HSIF?: 1.25GHz, HSDR2 : 2.0GHz
(When module is installed on prober card)
T6391(ND4) 1.25GHz 2GHz (License)
Yokogawa TS670 80MHz
ST6730A 375MHz
ST6731A 375MHz 1.25GHz(GSIO)
工艺介绍